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The Vanta Element handheld X-Ray Fluorescence (XRF) analyzer provides elemental analysis for alloy grade ID. Rugged and suitable for demanding PMI applications. Data exportable via USB.
Measures the force required to pull a specified test diameter of coating away from its substrate using hydraulic pressure. Pressure is di..
Comprises an LCD display and a detachable detector/drive unit. Parameters measured in Ra, Rq, Ry, Rz, Rt, Rp, R3z, Rk, Rpk, Rvk, S, Sm, Pc,..
The Olympus 38DL Plus Ultrasonic Thickness Gauge performs non-destructive measurements. This unit is supplied with transducers that can meas..
Defelsco PosiTector 200 Advanced ultrasonic coating thickness gauge with type B & C Probes. Measures coating thicknes over wood, concre..
Tags: Olympus Vanta Element, handheld X-ray fluorescence, XRF analyzer, elemental analysis